The risk caused by patent grant delay and its effect

Abstract

Abstract: Under the multiple influencial factors, almost all the patent offices across the world including Chinese patent office are now facing the increasingly severe overstock problem, which results in the risk of patent grant delay. The impacts caused by patent grant delay is explored by analyzing the underlying influential factors; meanwhile, by constructing a simple model, it is found that the patent grant delay will distort competition and impair technological innovation. Therefore, it is suggested that Chinese patent office should reform the patent examination model immediately and formulate policies cautiously. When making patent-related policies, American patent rapid examination pattern should be used for reference. However more importantly, by setting and modulating request fees in the pattern of fast examination to bring the total number of applications for patent rapid examination under the control.

Key words: patent grant delay, market effect, technology innovation effect, patent rapid examination

CLC Number:

F062.4

Wen Jiachun. The risk caused by patent grant delay and its effect[J]. Science Research Management, 2012, 33(5): 139-145.

References

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