Science Research Management ›› 2013, Vol. ›› Issue (6): 99-105,114.

Previous Articles     Next Articles

Spatial econometric analysis on Chinese patent product efficiency

Ma Junjie1, Lu Rui2, Liu Chunyan1   

  1. 1. School of Law and Intellectual Property Institute, Tongji University, Shanghai 200092, China;
    2. Department of Science and Technology, Sanjiang University, Nanjing 210012, China
  • Received:2011-11-08 Revised:2012-01-08 Online:2013-06-27 Published:2013-06-18

Abstract: Under the assumption that scale returns are variance, the usage of Total Factor Productivity (TFP) analysis framework is introduced. From the angle of production theory, the factors of pure technical efficiency change, scale efficiency change, technical change, and technical efficiency change are comprehensively considered. The knowledge production function is used to built a DEA-Malmquist index of patent output performance which could be used to detect the dynamic change of the efficiency. And then the socio-economic panel data of 30 provinces (municipalities) in China during the period of 2000-2008 are used to conduct an empirical analysis on patent output performance. And the spatial econometric approach is adopted to make a comprehensive investigation on regional differences and impact of influence factors. The empirical result shows that the efficiency of patent output maintains an upward trend and presents a distribution pattern of spatial dependence and spatial heterogeneity at the global scale, and the most of innovators concentrate in the eastern coastal area of China. Besides, it is also found that the level of regional economic development, the industrial structure, and the level of urbanization exert the important positive influence on the efficiency of regional patent output, meanwhile the index of transaction value in technical market and educational population receiving the degree equal or above associate diploma per 100,000 persons make insignificant contributors to the efficient growth in the short term.

Key words: patent product, efficiency, Malmquist index, spatial econometric analysis

CLC Number: