科研管理 ›› 2016, Vol. 37 ›› Issue (4): 1-8.

• 论文 •    下一篇

中美产业创新能力比较:基于对IC产业的专家调查

薛澜1,陈玲1,王刚波2,蒋凌飞1   

  1. 1. 清华大学公共管理学院
    2. 北京理工大学管理与经济学院
  • 收稿日期:2015-01-06 修回日期:2015-10-21 出版日期:2016-04-20 发布日期:2016-04-13
  • 通讯作者: 陈玲
  • 基金资助:

    国家自然科学基金青年项目(编号:71203199),2012.1-2015.12;国家自然科学基金青年项目(编号:71201145),2012.1-2015.12;国家自然科学基金面上项目(编号:71472170),2015.1-2018.12。

A comparison of the industrial innovation capacity between China and the U.S. based on expert surveys in the IC design industry

Xue Lan1, Chen Ling1, Wang Gangbo2, Jiang Lingfei1   

  1. 1. School of Public Policy and Management, Tsinghua University, Beijing 100084, China;
    2. School of Management and Economics, Beijing Institute of Technology, Beijing 100081, China
  • Received:2015-01-06 Revised:2015-10-21 Online:2016-04-20 Published:2016-04-13

摘要: 本文采用专家调查方法来测度产业创新能力的国际差距。我们通过锚点校准法,提高了专家调查方法的结果的可靠性。将该方法运用到中美两国的集成电路设计产业中,了解专家群体对该产业创新产出和创新能力的主观判断,从而测量中美两国之间集成电路设计产业创新能力的差距。调查结果表明,中美两国的集成电路设计产业技术能力相差约40个月。研究还对两国的创新环境和创新政策进行了比较。总之,基于专家调查的创新能力评测为传统的创新测量提供了一个有益的补充。

关键词: 创新测度, 专家调查, 锚点校准法, 集成电路设计

Abstract: This paper measures the international gap of industrial innovation capacity through expert survey method. By selecting proper samples and anchoring vignettes, we improve the reliability of the result of the expert survey method. Then, we apply the expert survey method in the IC design industry in China and US. The survey provides the subjective opinions of expert groups on the industrial innovation output and capacity. It also concludes that the gap of IC industrial innovation capacity between China and US is 40 months at that time. By comparing the innovation environments in China and US, policy implications are drawn from the survey. The expert survey method offers a complementary view to the tradition methods of innovation capacity measurement.

Key words: innovation measurement, expert survey, anchoring vignette, IC design